The purpose of this course is to introduce students the basic principles and applications of transmission electron microscopy (TEM) for the study of ferrous and battery materials. The lecture is composed of theoretical study and practice. After study of each topic, TEM laboratory will be followed. The first part of lecture will cover the basics of electron optics, structure of TEM, and principles of electron diffraction. Geometry of electron diffraction and Kikuchi lines to the structure analysis will be emphasized. The basics of TEM alignment and electron diffraction, and the application of Kikuchi line will be treated in the TEM laboratory. In the second part, theory of image contrast in TEM will be presented. Kinematical theory of diffraction contrast will be discussed with examples of crystalline defects such as dislocations, stacking faults and inclusions. The principles of other commonly used methods will also be presented. These include High Resolution TEM (HRTEM), Scanning TEM (STEM), and Spectrometry (EDS,EELS). Students will have a chance to practice above topics in TEM laboratory and final team project. This course offers only the basic principles of TEM.

N.A.

Mid-term exam.(30%), attendance(10%), Report(10%), final presentation (50%)

J.P. Hirsch et al. : Electron Microscopy of Thin Crystals, Robert E. Krieger Publishing Co. 1977
Jian Min Zuo, John C.H. Spence: Advanced Transmission Electron Microscopy, Springer, 2017

1st week : Introduction (Fundamentals of Microscopy, Structure of TEM)
2nd week : Diffraction I (Principles of electron diffraction)
3rd week :TEM laboratory (TEM alignment)
4th week : TEM laboratory (Diffraction contrast; BF and DF imaging)
5th week : Diffraction II (Geometry of electron diffraction, Kikuchi lines and
their applications)
6th week : TEM laboratory (Two-beam condition and dislocation analysis)
7th week : Contrast methods in TEM
8th week : Mid Term Exam

9th week : Theory of Image Contrast (I)-Kinematical Approach
10th week : Theory of Image Contrast (II)-Defect Contrast
11th week : High Resolution TEM (Phase Contrast)
12th week : TEM laboratory (High Resolution TEM)
13th week : Scanning TEM (STEM) and spectroscopy
cf) Discussion on the final team project and start
14th week : TEM laboratory (STEM, EDS, and EELS)
cf) Team project
15th week : Team project (or preparation of personal presentation)
16th week Presentation on the team project(or preparation of personal presentation)

Off-line lecture
Lecture + Laboratory