3. 강의목표
Device sizes are rapidly decreasing to the nanoscale. As device sizes decrease, various structural and physical characteristics not previously observed in devices measuring from a few μm to several hundred nanometers are becoming more prominent. Therefore, there is a pressing need for device property theories and analysis techniques capable of accurately describing physical phenomena, including quantum effects. Therefore, this course combines physical theory-the foundational elements of IT convergence device research—with cutting-edge measurement and analysis techniques, introducing circuit technology utilizing next-generation devices.
4. 강의선수/수강필수사항
Pre-consent is required to attend this course.
5. 성적평가
| 중간고사 |
기말고사 |
출석 |
과제 |
프로젝트 |
발표/토론 |
실험/실습 |
퀴즈 |
기타 |
계 |
|
|
|
|
|
|
|
|
|
|
| 비고 |
Midterm (40%), Final (40%), Homework (10%), Attendance (10%)
|
7. 참고문헌 및 자료
- Device Electronics for Integrated Circuits, 3rd Edition (R. S. Muller, T. I. Kamins)
- Semiconductor Material and Device Characterization, 2nd Edition (D. K. Schroder)
- Physics and Technology of Semiconductor Devices (Andrew S. Grove)
- Silicon Processing for the VLSI Era, Vol. 4 (S. Wolf)
8. 강의진도계획
- 1~2주 : What is Next Generation Devices and Circuits?
- 2~5주 : Basic Device Physics from PN junction to MOSFET (including Reliability issues)
- 5~6주 : Basic Measurement Technique (Resistivity, Carrier Density, etc)
- 7주 : Midterm examination
- 8~10주 : Advanced Measurement Technique (Series Resistance, Defects, etc)
- 10~13주: Next-generation Devices and its physics
(including Quantum Physics and FinFET, Nanowire, Biosensor, Solar cell, LED etc.)
- 13~15주: Applied Circuits using Next-generation devices
- 16주 : Final examination
11. 장애학생에 대한 학습지원 사항
- 수강 관련: 문자 통역(청각), 교과목 보조(발달), 노트필기(전 유형) 등
- 시험 관련: 시험시간 연장(필요시 전 유형), 시험지 확대 복사(시각) 등
- 기타 추가 요청사항 발생 시 장애학생지원센터(279-2434)로 요청