The course covers the topic of transmission electron microscopy (TEM) used for quantitative structural studies, especially at the atomic level (electron crystallography). It includes determination of unit cell size, plane and space groups using different diffraction and high-resolution electron microscopy. In addition, the course covers the use of quantitative structural models directly from electron diffraction and from the images. The course also includes dynamic diffraction theory (block wave, dispersion surface, Kikuchi lines) and scanning transmission electron microscopy (STEM), which can be used for studying defect structures such as dislocations and nanomaterials.

This class is recommended for the students who want to operate TEM in MSE department and observe/analyze their samples for themselves.
Students who are not in the MSE department must register for this course with a letter grade. Registration on a S/U basis is not permitted.

1. D. B. Willliams and C. B. Carter, Transmission Electron Microscopy
2. 신기삼, 이확주, 김긍호, 박주철 저, 투과전자현미경 이론과 응용
3. 이정용 저, 기초전자현미경

1. Introduction to TEM
2. Fundamental for TEM operation
3. Excercise: Sample Loading and Sample Tilting with Kikuchi Patterns
4. Diffraction – Selected Area Diffraction and Convergence Beam Electron Diffraction
5. Analysis on Diffraction using Simulation
6. Excercise: Case study for Diffraction
7. Diffraction Imaging and Tilt – Bright Field and Dark Field Imagning
8. Excercise: Case study for Diffraction Imaging
9. High Resolution TEM (HRTEM)
10. Simulation for HRTEM analysis
11. Excercise: Case Study for HRTEM
12. High Resolution STEM
13. Simulation and Ab-initio Calculation for STEM analysis
14. Excersice: Case Study for HRSTEM
15. Sample Preparation

[Notice] ================================================================================
- This lecture is mostly oriented to the Ph D candidate (integrated course), due to the limited number of students.
- Ph D student has a higher priority for this lecture.
- If you are a Ph D candidate, who wants to take this lecture but can't apply, please send me an email.
- Then, the student list can be adjusted in February.
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By self-training for 10 hours for 1 month during or after the class, the student is qualified to be a C-grade user of TEMs (JEOL 2100F and Hitachi normal TEM) in the MSE department.
A C-grade user can be promoted to be a B-grade user by further 20 hour self-training within 1 month (or 30 hour self-training within 2 month.)
* Qualification as a user can be guaranteed without the critical accident during self-training.
* B-grade user: access to JEOL 2100F and Hitachi normal TEM at day and night time
* C-grade user: access to JEOL 2100F and Hitachi normal TEM only at day time
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TEM is one of the best tools to understand the materials. However, without analyzing the sample by oneself and with an assistance of the technical staff, one can never understand the data and unveil the important, hidden information from TEM images.
MSE in POSTECH has a great environment to experience TEM as a real user which is usually not available in most universities. This class wants to give a change to materials scientists in POSTECH to utilize TEM into their research and to truly understand their materials using TEM.